小角度X光散射儀 (Small Angle X-Ray Scattering System, SAXS)

SAXS Workshop held on 2005/4/6

Instrument Summary

SAXS Specifications

Unique Features of the SAXS
Service Items
Specimen Limitation
Contact Persons
Application Procedures

Service Time

Down Time for the years 2023, 2024, 2025, and 2026

Service Charge


Instrument Summary

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SAXS Specifications

Specifications for High Resolution SAXS System
Item No. Description Specification Unit Amount Remarks
1a. PSAXS 小角度X光散射針孔系統 (Small Angle X-ray Scattering Pinhole System) (1)具氣動作用之過濾箱 (Filter box w/pneumatic actuation); (2) 三針孔室 (*兩個針孔用作光束定義 *一個保護針孔置於樣品之前) (Three pinhole housings: * Two (2) pinholes for beam definition * One (1) guard pinhole before sample); (3) 內嵌光電二極體之光束停止點,以提供穿透因子;內含電流/電壓放大器 (Photodiode beamstop to provide transmission factor; current/voltage amplifier included); (4) 由系統真空之外以人工狹縫定位 (Manual slit positioning from outside of system vacuum); (5) 提供安裝至點光源(管或旋轉陽極) )(Mounting provided to point source (tube or rotating anode)); (6) 最大之可測量空間尺寸為100奈米 (Maximum spacings up to 100 nm); (7) 散射向量 k值範圍為0.054 至 1.6 奈米分之一 (k = (4(pi)sin(2 theta)/(lamda))range: 5.4E-2 nm-1 < k< 1.6 nm-1); (8) 提供AgBehenate(二十二酸銀)材料做為校正標準品 (AgBehenate Standard); (9) 提供對齊調整及疑難解答的文件資料 (Documentation for Alignment and Troubleshooting); (10) 分段光束允許偵測器移近至樣品,以測量小於0.2奈米之空間尺寸(Segmented beam allows the detector to move closer to the sample for measuring D-spacings smaller than 0.2 nm.) 組(set) 1 Required for basic system

Scattering vector range sufficient to probe dimensions (100 nm) down to 1st order WAXS hydrocarbon spacing (with adjustment of flight path length)

Continuous vacuum environment and automation of sample handling

Fixed sample positions with overlapping ranges in k-space

1b. 通用樣品夾具及更換器(Universal Sample Holder and Changer) (1) 真空樣品室 (Vacuum sample chamber) *具可移動門,可供常壓下之樣品測量及反射模式下之測量 (Removable Doors for atmospheric samples, reflection module.); (2) 1個繼動馬達驅動台,供垂直方向移動 ((1)Stepper motor-driven stage for vertical translation); (3) 2個NW25號進料口, 可供管線在真空下進出樣品箱 ((2) NW25 ports for feedthroughs); (4) 3個NW16號進料口, 可供管線在真空下進出樣品箱 ((3) NW16 ports for feedthroughs); (5) 含固態樣品夾具 (Solid sample holder included); (6) 樣品室底部有真空入口,用作運動輸入口 (Vacuum port access through the chamber base for motion feedthrough); (7) 電纜 (Cables); (8) 完全可程式化,具Labview驅動程式 (Fully programmable w/Labview Drivers); (9) 自動產生軟體腳本,包括掃瞄等內容 (Automated software script creation to include scanning and) 組(set) 1 Industry standard vacuum fittings

Positive locking on doors for uniform vacuum sealing

2. Y-SCAN 水平掃瞄 (Horizontal Scanning) (1) 樣品夾具以水平繼動馬達移動 (Horizontal stepper-motor translation of the sample holder); (2) 10微米之解析度(10 micron resolution); (3) 50毫米(正負25毫米)之行程(50 mm(+-25mm) travel); (4) 馬達及移動台位於主真空室之外 (Motor and translation stage is located outside the main vacuum chamber) 組(set) 1 Automated sample scanning in the horizontal plane, normal to the beam axis

Motion control fully integrated with vertical sample translation for precision scanning

3. CMF-MS 點收束型集光鏡- 小角度X光散射儀之微光源 (CMF Optic – Micro Source for SAXS) (1) 為小角度散射所設計之點收束型集光鏡 (Confocal Max-FluxTM optics designed for Small Angle Scattering); (2) Bede公司之微光源,特別搭配CMF點收束型集光鏡 (電子束撞擊銅靶產生的X光波長) (Bede Micro Source configured for CMF optics (Cu wavelength)); (3) 冷卻裝置 (chiller); (4) 完整硬體,用以整合微聚焦光源與CMF點收束型集光鏡 (Complete hardware that integrates the Micro Focus source and the CMF optic) 組(set) 1 High Brilliance Source

Low Maintainance

4a. 2D-120X 二維X光面積偵測器 (Two Dimensional X-ray Area Detector) (1) 多接線、充氣比例類型 (Multiwire, gas-filled proportional type); (2) Gabriel 設計(Gabriel design); (3) 真實之120毫米直徑之有效面積 (True 120mm diameter active area); (4) 大約200微米之解析度(c.a. 200 micron resolution); (5) 最大每秒十萬次計數 (1x105 maximum counts/sec); (6) 基本分析之套裝軟體 (用Matlab語言寫成) (Basic Analysis Package (in Matlab)); (7) 原子量55的鐵,做為偵測器效率校正之用 (Fe55 source for detector efficiency calibration)。註:鐵55為美國管制的出口品,故本實驗室目前無第(7)項校正品。(Due to the restriction to Fe55 for export by US Government, we have not received the calibration item of Fe55 from MolMet/Osmic so far.) 組(set) 1 Single photon counting for low noise detection with effectively infinite dynamic range

120 mm active diameter is larger than other commercial multiwire detectors

4b. 二維偵測器之 數據收集電子元件(Collection Electronic for 2-D Detector) (1) 標準NIM之資料收集電子元件 (Standard NIM electronics for data collection); (2) FASTComtec 二維多頻道分析器,附上數據摘取軟體,可於視窗及LabView環境下操作 (FASTComtec 2-Dimensional Multichannel analyzer with data acquisition software running under Windows and LabView); (3) 對單一事件具次微秒之時間印記功能 (Submillisecond timestamping for individual events); (4) 電纜 (Cables); (5) 內含個人電腦 (PC included) 組(set) 1 Time-stamping for temporal resolution in pump/probe or steady state experiments
5. Base-X 支撐底座達12英尺長之光學砧板 (Support Base up to 12』 long Optical Breadboard) (1) 21英吋寬之光學桌,具T型槽可連續放置各元件 (21」 wide Optical Bench w/T-slots for continuous placement of components); (2) 模組式鋁結構 (Modular Aluminum Structure); (3) 長度由可使用的空間決定 (Length determined by available space) 組(set) 1 Required for basic system
6. VAC 真空泵送站,具配件、管子、油霧過濾器、及儀表(Vacuum pumping station w/fittings, hose, oil mist filter, gauge)
組(set) 1 Vacuum required for basic system
7. Xray-Eye 遠距錄影X光監視器( Remote Video X-ray Monitor) Price Includes(價格包括): (1) 電視監視器 (TV Monitor); (2) 電纜(Cables) 組(set) 1 Required for basic system

Provides a safe and remote way of finding the beam during alignment

8. Analysis-Soft 小角度X光散射儀數據分析軟體 (SAXS Data Analysis Software) (1) Matlab語言為基準之圖形使用介面 (Matlab-based GUI); (2) 背景消去功能 (Background subtraction); (3) 影像置中功能 (Image centering); (4) 對等方性散射體,具極座標轉換功能 (Polar coordinate transform for isotropic scatterers); (5) 對非等方性散射體,具主軸決定及橢圓覆蓋功能 (Principal axis determination and elliptical overlay for anisotropic scatterers); (6) 展開至theta?方位角對散射向量k之笛卡爾座標系 (Unwrapping to theta vs. k Cartesian coordinate system); (7) 對theta?方位角及散射向量k積分; (8) 使用在數據摘取時所建立之參考檔案,自動簡化數據(背景消去、正規化)(Automated data reduction (background subtraction, normalization) using file references setup at the time of data acquisition) 組(set) 1 Another powerful analysis software, POLAR, has been purchased from Stonybrook Technology & Applied Research, USA, for later use.
9. USH 另一組通用樣品夾具及更換器用於中角度X光散射(Additional Universal Sample Holder and Changer for Mid-Length SAXS) 與1b. 相同 (Same as 1b.) 組(set) 1 Additional sample chamber for mid-length SAXS

Identical

Industry standard vacuum fittings

Positive locking on doors for uniform vacuum sealing

10. 300STG 高溫樣品夾具 (High Temperature Sample Holder) (1) 溫控由攝氏零下30至300度,溫度精確度為攝氏正負1度,結合液態冷媒(由使用者自行提供液態氮杜瓦瓶)及積分加熱器為之 (Temperature control from below –30 to 300oC with +/-1oC precision using a combination of fluid coolant (N2 dewar blowoff, provided by customer) and integral heater); (2) 完全的冷卻管線以利快速冷卻及低溫溫控 (Integral cooling lines for faster cooling and low temperature control); (3) 真空下操作 (Operates in Vacuum); (4) 針對置於MolMet樣品更換器之一個樣品而安裝 (Mounting for (1) one sample from MolMet sample changer); (5) 包括四個樣品盛裝器 (300-C-revB型號) (Includes 4 sample cells (models 300-C-revB):* 不銹鋼材質 (Stainless Steel construction) * 適用於液體或固體 (Suitable for liquid or solids) * 含雲母材質之視窗 (Mica windows included) *具溫度穩定性及耐化性之Kalrez密封材料 (Kalrez seals for temperature stability and chemical resistance) * 1毫米及2毫米之樣品厚度 (1 mm and 2 mm sample thickness) 組(set) 1
11. USH-Caps 常壓蓋 (Atmospheric Caps) 說明(Description):(1) 將入射及散射真空飛行路徑與樣品隔離 (Isolates the incident and scatter vacuum flight paths from sample) ; 價格包括(Price includes):(1) 輪緣安裝在通用樣品夾具(USH)室內 (Flanges mount inside USH chamber); (2) Kapton材料視窗,以利X光穿透 (Kapton windows for x-ray transmission) 組(set) 1
12. WAXSSYS 為導入廣角度X光散射測量之影像板的閉鎖及安裝室(Lock and Load Chamber for Introducing Image Plate for WAXS) (1) 安裝在主要小角度X光散射室旁的閉鎖及安裝進料口 (Lock and Load feedthrough mounted on side of main SAXS chamber); (2) 影像板導入及移開系統,均不會中斷主要的真空 (Image plate is introduced and removed from system without breaking main vacuum); (3) 控制軟體被部份變更,以關閉光束快門,並提示使用者何時該更換影像板 (Control software is modified to close the beam shutter and flag user when to change image plate); (4) 廣角範圍的上限至散射角2 theta為68度(Wide angle range up to 68 degrees in 2 theta); (5) 含離線之影像板讀取器 (FUJI BAS1800型) (Off-line Image Plate reader (FUJI BAS1800); (6)提供與用於二維多線式偵測器的相同分析軟體 (Same analysis software as used for 2D multiwire detector) 組(set) 1 Provides Full Wide Angle Scattering Capability

Image plates used for best resolution and no parallax from scattering at high angles

Software flags user to change film before moving to new sample

13. BS-PD 額外有光電二極體嵌入之光束停止點( Additional Beamstop w/photodiode) (1) 由使用者指定光束停止點直徑之光束停止點組合 (Beamstop assembly of user-specified beamstop diameter); (2) 三個與此一光東停止點搭配好之針孔組合 (Set of three matching pinholes); (3) 連接至光電二極體計的連接頭 (plugs into photodiode meter) 組(set) 1 Additional pinholes and beamstop to match beam size for increased flux at lower resolution

We have two available pinhole-beamstop combinations: (1)High resolution --- PH1 (0.40 mm in diameter), PH2 (0.20 mm), PH3 (0.70 mm), and Beamstop#1 (4 mm in diameter); High flux --- PH1 (0.80 mm in diameter), PH2 (0.40 mm), PH3 (1.3 mm), and Beamstop#2 (7 mm in diameter)

14. CAP 石英毛細管之夾具 (Holder for Quartz Capillary) (1) 一個1.5毫米直徑之石英毛細管 (One(1) 1.5 mm diameter quartz capillaries); (2) 具溫控用冷水管線之熱塊 (Thermal block with water feed lines for temperature control); (3) 安裝至樣品更換器USH (Mounts to sample changer USH); (4) 系統在真空下,仍可允許液體流動之設計 (Designed to allow liquid flow while system is under vacuum); (5) 提供額外的毛細管(Comes with extra capillary); (6) 如損壞,毛細管可再安裝 (Capillaries can be remounted if damaged) 組(set) 1 Designed to hold capillary tubes for low viscosity fluids

Allow fill and drain without breaking vacuum system

15. Cap-Basic 基本毛細管盛裝器 (Basic Capillary Cell) (1) 可重覆使用,1.5 mm 之石英毛細管 (Reusable, 1.5 mm quartz capillary); (2) 安裝在標準樣品安裝裝置上的針定位器之設計 (Designed to be mounted on pin locators on standard sample mount); (3) 真空相容,以O型環密封,不銹鋼材質製造 (Vacuum compatible, O-ring sealed, stainless steel construction) 組(set) 1 Basic Capillary holder without temperature control

Fits on sample mount in pinned position

16. Det-Cassette 放置小角度X光散射之影像板的卡式盒(SAXS Cassette for Image Plate) (1) 卡式盒允許Fuji影像板放置在小角度X光散射的位置 (Cassette allows Fuji image plate to be loaded in SAXS position) ; (2) 碳纖維視窗(與用於2-D120X者相同)讓使用者能夠在不中斷真空的條件下更換影像板 (Carbon fiber window (Same as on 2D-120X) enables user to exchange image plates without breaking vacuum) 組(set) 1 Allow Fuji image plate to be mounted on back of system in place of multiwire detector
17. Fiber-View 樣品可視化 (Sample visualization) (1) 光學纖維感測器連結至攝影機,使肉眼能從影像輸出觀測到樣品 (Fiber optic couple camera with video output for sample observation); (2) 可調式影像之十字形叉絲,可定位光束位置 (Adjustable image cross-hair for locating beam position)) 組(set) 1 Video imaging simplifies alignment of small samples

Locate specific sample positions for scattering

18. GI-REF 輕擦界面入射角(或低掠角)/反射度模組 (Grazing incidence/ Reflectivity Module) (1) 雙重chi-circle片斷,可旋轉2 theta角度及繞光束中心旋轉 (Dual chi-circle segment to rotate 2 and around beam axis); (2) 精準的z-工作站,可使反射度中心與旋轉軸對齊 (Precision z-stage to align reflectivity center with rotation axis); (3) 內含繼動馬達及驅動器 (Stepper motors and drivers included); (4) 提供LabView實例 (LabView examples given) 組(set) 1 SAXS measurements under grazing incidence conditions

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Unique Features of the Osmic SAXS System(美國Osmic公司「高解析度小角度X光散射儀系統」之獨家特點)

1) Source(光源)

a. Microsource with confocal beam conditioning optic(具點收束型集光鏡之微X光源)

i. Provides monochromatic beam with intensity greater than focused radiation from existing rotating anodes with the exception of the Rigaku 007.(提供單一波長之光束,其光束強度高於,除了Rigaku007以外,現有之旋轉陽極靶所產生之聚焦輻射。)

ii. Operates at only 35 Watts and uses 110V VAC; no special power requirements needed(在35瓦的低功率下操作,並使用110伏特的交流電壓;不需特殊的功率。)

iii. Maintenance comparable to a conventional sealed tube source. (維修與傳統的密封管式的X光光源一樣簡單)

2) Camera(相機):

a. 3 pinhole geometry with user-exchangeable pinholes(具使用者可更換針孔之三針孔幾何系統)

i. Pinholes can be exchanged for variable flux/resolution without dismantling the entire system. (針孔可更換,以調整光束通率及解析度,不需拆除整個系統。)

ii. Pinholes can be moved out of the way to expose a large through-hole for sequential pinhole alignment. (針孔可移開自原有光徑,以便暴露一個大的貫通孔洞,以利連續之針孔對齊調整)

b. Open Platform design. (開放式平台設計)

i. The only system to offer additional scattering chambers (for different k-space ranges), simultaneous wide angle scattering using image plates, and a surface scattering/reflectivity stage, to name just a few unique options. (本系統獨一無二,提供了額外的散射室(以適用於不同的散射向量空間之範圍),可同時以影像板測量廣角度散射,及提供測量表面散射/反射度的工作台,以上僅略舉數例。)

c. Large sample chamber with the optional ability to cover the incident and scattered beam paths with windows for samples in ambient or other non-vacuum environment.( 大型的樣品室,具含蓋入射及散射光束路徑的選擇能力,並開有視窗,以利常壓或非真空環境下的樣品測量。)

d. The sample changer drive mechanism is mounted outside the sample chamber to maximize the available space inside the chamber.( 樣品更換器驅動機制是安裝於樣品室之外,以使樣品室內的可用空間最大化。)

e. An x-ray photodiode is provided inside the sample chamber to be used for performance diagnostics and also fine tuning the alignment of the monochromator optic and the pinhole positions. (提供一個X射線光電二極管於樣品室內,用以診斷操作性能,及微調單光器光學系統是否對齊及針孔位置。)

f. Video display of the beam position on the sample simplifies the alignment of small samples. (影像顯示在樣品上的光束位置,簡化了小樣品的對齊調整。)

g. The beamstop is embedded with an x-ray sensitive photodiode for in-situ transmission measurement. (光束停止點嵌入了一個對X射線敏感之光電二極體,以提供即時穿透式的測量功能。)

3) Detector(偵測器) :

a. 2D Multiwire, gas-filled proportional type with(二維、多接線、充氣比例類型具有):

i. 120mm active diameter(120毫米之有效直徑。)

ii. Sub-microsecond time stamping for performing time resolved or periodic pump/probe experiments without waiting for data storage. (次微秒時間印記功能,以執行時間分離或週期性之泵送/探測實驗,不需等待資料儲存。)


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Service Items

Service Items for High Resolution SAXS System
Item No. Item Description k-range (nm-1) 2 theta-range (o) D-spacing (nm) Remarks
A 一般測量(General Measurements)



固態樣品、室溫、抽真空、及穿透模式下測量(Tests for solid sample under room temp.(20C), vacuum condition (< 10 mtorr), and transmission mode of X-ray beam)
1 小角度X光散射測量(Small Angle X-ray Scattering, SAXS) (1)Plotting of scattered intensity vs. k or 2 theta; (2) Two dimensional plot of scattered intensity 5.4E-2 to 1.6 0.07-2.2 115-3.8 (1) One calibration sample (AgBehenate standard) will be run, which takes about 1hr, before the test of the first sample every day.

For a 20-min exposure time for the sample, the SAXS experiment takes about 80 min, which includes sample loading (10 min), waiting for vacuum setting (20 min), adjusting the sample (10 min), data acquisition of the scattered intensity (20 min), and post-treatment of the data (20 min).

2 中角度X光散射測量(Medium Angle X-ray Scattering, MAXS) (1)Plotting of scattered intensity vs. k or 2 theta; (2) Two dimensional plot of scattered intensity 0.16 to 4.8 0.22-6.7 38-1.2 Same as item 1

3 廣角度X光散射測量 (Wide Angle X-ray Scattering, WAXS) (1)Plotting of scattered intensity vs. k or 2 theta; (2) Two dimensional plot of scattered intensity 2.0 (3mm thru hole in plate) to 45 (for a plate with 150 mm diameter) 2.8-67 3.1-0.14 (1) One calibration sample (Silicon powder standard from NIST, USA) will be run, which takes about 70 min, before the test of the first sample every day.

(2) For a 20-min exposure time for the sample, the WAXS experiment takes about 90 min, which includes sample loading (10 min), waiting for vacuum setting (20 min), adjusting the sample (10 min), recording of the scattered intensity by image plate (20 min), off-line reading of the image plate (10min), and post-treatment of the data (20 min).

(3) The WAXS and SAXS experiments can be conducted simultaneously for our system. However, the MAXS experiment has to be performed alone.

B 20-300C變溫測量(Measurements at varied temperatures from 20 to 300 C) SAXS


(1)固態樣品或高分子熔融體、抽真空、及穿透模式下測量(Tests for solid sample or polymer melt under vacuum condition (< 10 mtorr), and transmission mode of X-ray beam)

94/8/25起開放服務(open for service starting from Aug. 25, 2005)

C 液態樣品室溫下測量(Measurements for liquid sample under room temperature) SAXS, MAXS, and WAXS


(1)液態樣品、室溫、抽真空、及穿透模式下測量(Tests for liquid sample under room temp.(20C), vacuum condition (< 10 mtorr), and transmission mode of X-ray beam)

94/9/12起開放服務(open for service starting from Sep. 12, 2005)

D 液態樣品變溫下測量(Measurements for liquid sample under varied temperatures) SAXS


(1)液態樣品、變溫、抽真空、及穿透模式下測量(Tests for liquid sample under varied temp. (20-300C), vacuum condition (< 10 mtorr), and transmission mode of X-ray beam)

僅開放SAXS服務(only open for SAXS service)

E 固態樣品低掠角/反射度測量(Measurements for solid sample using grazing incidence/reflectivity module) SAXS


已於2013/5/1正式開放對外服務 (has been in service since May 1, 2013)
F 常壓、室溫下測量(Measurements under ambient pressure and room temperature) SAXS


94/9/12起開放服務 (open for service starting from Sep. 12, 2005);固體樣品或液體樣品皆可測量,可測量小角度及廣角度散射。(Either solid sample or liquid sample can be measured under the above conditions. The measurement is for both SAXS and WAXS.)

G 線上即時測量(Real-time measurements) SAXS or MAXS


X光光源強度不足,無法提供服務。請洽新竹國家同步輻射研究中心。(We are unable to provide such a service due to the inadequate intensity of the X-ray source in our lab. Please contact NSRRC at Hsintsu.)

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Specimen Limitation


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Contact Persons


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Application Procedures

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Service Time

Service Time for High Resolution SAXS System

Mon Tue Wed Thur Fri Remarks
8:30 am-12:30 noon 3 2 1 2 1
13:30 pm-17:30 pm 3 2 1 2 1







1: 校內貴儀使用者預約 (reserved for faculty members or graduate student at NTUST having NSTC account entitled to use precious instruments of the NSTC-sponsored labs)

2: 校外貴儀使用者預約 (reserved for faculty members or graduate student from other university or research organization having NSTC account entitled to use precious instruments of the NSTC-sponsored labs)

3:願意繳交現金之使用者預約 (reserved for applicants willing to pay cash to use the SAXS system)

3:每月第二及第四個週一,儀器停機一天,更換針孔系統及光束停止點。遇假日則順延至次一個上班日。 (For the second and fourth Monday of each month, the SAXS system will be down for changing the pinhole and beamstop. Should it be a holiday for that Monday, the down time for the SAXS system will be delayed to the nearest working day.)

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Down Time for the Years 2023, 2024, 2025, and 2026

Down Time for the Years 2023, 2024, 2025, and 2026

Second Monday of the month (switching to high-resolution pinholes) Fourth Monday of the month (switching to high-flux pinholes) Remarks
2023


Jan 1/9 1/23
Feb 2/13 2/27
Mar 3/13 3/27
Apr 4/10 4/24
May 5/8 5/22
June 6/12 6/26
July 7/10 7/24
Aug 8/14 8/28
Sep 9/11 9/25
Oct 10/9 10/23
Nov 11/13 11/27
Dec 12/11 12/25
2024


Jan 1/8 1/22
Feb 2/12 2/26
Mar 3/11 3/25
Apr 4/8 4/22
May 5/13 5/27
June 6/10 6/24
July 7/8 7/22
Aug 8/12 8/26
Sep 9/9 9/23
Oct 10/14 10/28
Nov 11/11 11/25
Dec 12/9 12/23
2025


Jan 1/13 1/27
Feb 2/10 2/24
Mar 3/10 3/24
Apr 4/14 4/28
May 5/12 5/26
June 6/9 6/23
July 7/14 7/28
Aug 8/11 8/25
Sep 9/8 9/22
Oct 10/13 10/27
Nov 11/10 11/24
Dec 12/8 12/22
2026


Jan 1/12 1/26
Feb 2/9 2/23
Mar 3/9 3/23
Apr 4/13 4/27
May 5/11 5/25
June 6/8 6/22
July 7/13 7/27
Aug 8/10 8/24
Sep 9/14 9/28
Oct 10/12 10/26
Nov 11/9 11/23
Dec 12/14 12/28

1. The down time for the SAXS system is for the change of the pinhole systems. On the second Monday of the month, the pinhole will be switched to the high-resolution one, whereas on the fourth Monday of the month, it will be switched to the high-flux one. 2. 自112/1/1起,除非使用人特別預約high-resolution模式(依據上表的排程),pinhole均維持high-flux模式。

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Service Charge

Service Charge for High Resolution SAXS System

Mon Tue Wed Thur Fri Remarks
8:30 am-12:30 noon 2 1 1 1 1
13:30 pm-17:30 pm 2 1 1 1 1







1: 109/1/1 起,本校SAXS 不再申請參加國科會貴儀服務,但仍列為台科大 的校內貴儀,有網址連結(http://libraryfile.lib.ntust.edu.tw/yjhuang/ saxs.htm),提供校內外的服務(每4 小時收費新台幣800 元現金)。使用本實驗室準備自美國進口之石英毛細管者,每枝毛細管額外收取新台幣400元現金(四佰元)材料費。(註: SAXS 於2018 年7 月份更換X 光光管及高壓電源供應器(合計美金66,465 元,約新台幣200 萬元),目前運作正常。)

2:自民國108年1月1日起,計畫付費的使用者,每服務單元(4小時)之收費標準調降為新台幣16000元(Starting from January 1, 2019, for users with NSTC project, the charge rate will be NT 16000 dollars per service unit (1 service unit = 4 hours);自2005/6/6起,使用本實驗室準備自美國進口之石英毛細管者,每枝毛細管額外收取新台幣4000元(四仟元)材料費。茲建議申請人自行向美國Charles Supper公司購買管壁厚度為0.01mm,直徑為1mm或2mm之專用毛細管。(Starting from June 6, 2005, for those who are going to use quartz capillary which is imported from USA and prepared by our lab, another NT 4000 dollars for each of quartz capillary tube used for the sample test will be charged. It is suggested that the applicant should buy their own capillaries,with a wall thickness of 0.01mm, and a diameter of 1 or 2 mm,from Charles Supper Company,USA.)

3:現金付費的使用者,每服務單元(4小時)之收費標準為新台幣6000元;使用本實驗室準備自美國進口之石英毛細管者,每枝毛細管額外收取新台幣400元(四佰元)材料費。(均限現金,請至本校總務處出納組繳納)(For users paying cash, the charge rate is NT 6000 dollars (in cash) per service unit (1 service unit = 4 hours). For those who are going to use quartz capillary which is imported from USA and prepared by our lab, another NT 400 dollars for each of quartz capillary tube used for the sample test will be charged. The applicant should pay cash at the Cashier Division under the General Affairs of the NTUST.)

*使用本實驗室準備自美國進口之石英毛細管者,每枝毛細管額外收取新台幣400元材料費(限現金,請至本校總務處出納組繳納)。(For those who are going to use quartz capillary which is imported from USA and prepared by our lab, another NT 400 dollars for each of quartz capillary tube used for the sample test will be charged. The applicant should pay cash at the Cashier Division under the General Affairs of the NTUST.)

**一個服務單元為4小時;未滿4小時,一律以4 小時計。 (Each service unit is 4 hours. For the service time less than 4 hours, it will still be counted as one unit.)

***實驗結果及圖形,在您的服務單元結束後,立即取回。請自備隨身碟儲存檔案資料。(The experimental results and plots will be obtained as soon as one』s service unit is over. Please bring your own removable hard disk with you for data storage.)

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Acknowledgement

The permission for downloading ballicons used in this webpage from FREE ART Website at http://www.mccannas.com is greatly appreciated.

Last Updated: 12/30/2022
Yan-Jyi Huang huangyj@mail.ntust.edu.tw